Ieee Reliability

Probability and Statistics with Reliability, Queuing, and Computer Science Applications, Second Edition

Probability and Statistics with Reliability, Queuing, and Computer Science Applications, Second Edition
Wiley | Applied Mathematics | Jul 5 2016 | ISBN-10: 1119285429 | 880 pages | pdf | 15.32 mb

by Kishor S. Trivedi (Author)

Encyclopedia of Cloud Computing  eBooks & eLearning

Posted by Underaglassmoon at Aug. 1, 2016
Encyclopedia of Cloud Computing

Encyclopedia of Cloud Computing
Wiley-IEEE | Networks, Protocols & APIs | Aug 1 2016 | ISBN-10: 1118821971 | 744 pages | pdf | 13.92 mb

by San Murugesan (Editor), Irena Bojanova (Editor)
Designing High Availability Systems: DFSS and Classical Reliability Techniques with Practical Real Life Examples (Repost)

Designing High Availability Systems: DFSS and Classical Reliability Techniques with Practical Real Life Examples by Zachary Taylor, Subramanyam Ranganathan
Publisher: Wiley-IEEE Press | 2013 | ISBN: 1118551125 | 480 pages | PDF | 26,6 MB

A practical, step-by-step guide to designing world-class, high availability systems using both classical and DFSS reliability techniques

Whether designing telecom, aerospace, automotive, medical, financial, or public safety systems, every engineer aims for the utmost reliability and availability in the systems he, or she, designs. But between the dream of world-class performance and reality falls the shadow of complexities that can bedevil even the most rigorous design process. While there are an array of robust predictive engineering tools, there has been no single-source guide to understanding and using them . . . until now.

Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n [Repost]  eBooks & eLearning

Posted by ChrisRedfield at July 25, 2014
Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n [Repost]

Eldad Perahia, ‚ÄéRobert Stacey - Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
Published: 2008-09-22 | ISBN: 0521885841 | PDF | 416 pages | 5 MB
Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n (Repost)

Eldad Perahia, Robert Stacey, "Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n"
English | 2008-09-22 | ISBN: 0521885841 | 416 pages | PDF | 5.72 mb

Electric Power Distribution Reliability, 2nd edition (repost)  eBooks & eLearning

Posted by fdts at March 15, 2013
Electric Power Distribution Reliability, 2nd edition (repost)

Electric Power Distribution Reliability, 2nd edition (Power Engineering)
by Richard E. Brown, H. Lee Willis
English | 2008 | ISBN: 0849375673 | 504 pages | PDF | 6.38 MB

Electric Power Distribution for Industrial Plants by IEEE (Repost)  eBooks & eLearning

Posted by tvladb at July 20, 2010
Electric Power Distribution for Industrial Plants by IEEE (Repost)

Electric Power Distribution for Industrial Plants by IEEE (Repost)
Publisher: IEEE Revised edition (January 1994) | ISBN: 1559373334 | Pages: 750 | PDF | 7.61 MB

A thorough analysis of basic electrical-systems considerations is presented. Guidance is provided in design, construction, and continuity of an overall system to achieve safety of life and preservation of property; reliability; simplicity of operation; voltage regulation in the utilization of equipment within the tolerance limits under all load conditions; care and maintenance; and flexibility to permit development and expansion.

Digital Switching Systems: Switching Reliability and Analysis (Repost)  eBooks & eLearning

Posted by lout at May 23, 2010
Digital Switching Systems: Switching Reliability and Analysis (Repost)

Digital Switching Systems: Switching Reliability and Analysis By Syed R. Ali
Publisher: McGraw-Hill 1997 | 217 Pages | ISBN: 0070010692 | PDF | 2 MB

Reliability Wearout Mechanisms in Advanced CMOS Technologies  eBooks & eLearning

Posted by tot167 at March 14, 2010
Reliability Wearout Mechanisms in Advanced CMOS Technologies

Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III, "Reliability Wearout Mechanisms in Advanced CMOS Technologies"
Wiley-IEEE Press | 2009 | ISBN: 0471731722 | 624 pages | PDF | 4,8 MB

IEEE LTE tutorial  Video

Posted by Ibaghdadi at Oct. 30, 2009
IEEE LTE tutorial

IEEE LTE tutorial
English | HTML | MP4 videos | 122 minutes | 110 MB

This is an IEEE webinar which contains all what you need to know about LTE by: Christina Gessner and Andreas Roessler