Heat Management in Integrated Circuits

Heat Management in Integrated Circuits: On-chip and System-level Monitoring and Cooling

Heat Management in Integrated Circuits: On-chip and System-level Monitoring and Cooling (Materials, Circuits and Devices) by Seda Ogrenci-Memik
2015 | ISBN: 1849199345 | English | 304 pages | PDF | 4 MB

Lateral Power Transistors in Integrated Circuits (Repost)  eBooks & eLearning

Posted by roxul at Sept. 26, 2016
Lateral Power Transistors in Integrated Circuits (Repost)

Tobias Erlbacher, "Lateral Power Transistors in Integrated Circuits"
English | ISBN: 3319004999 | 2014 | 244 pages | PDF | 7 MB

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices  eBooks & eLearning

Posted by tanas.olesya at March 7, 2016
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices by Daniel M. Fleetwood
English | 29 July 2004 | ISBN: 9812389407 | 297 Pages | PDF | 16 MB

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles and effects produced by the cumulative energy deposited by the radiation.

Thermal and Power Management of Integrated Circuits  

Posted by DZ123 at April 5, 2015
Thermal and Power Management of Integrated Circuits

Arman Vassighi, Manoj Sachdev, "Thermal and Power Management of Integrated Circuits"
English | 2006 | ISBN: 0387257624 | PDF | pages: 188 | 8,9 mb

Lateral Power Transistors in Integrated Circuits  

Posted by roxul at Nov. 13, 2014
Lateral Power Transistors in Integrated Circuits

Tobias Erlbacher, "Lateral Power Transistors in Integrated Circuits"
English | ISBN: 3319004999 | 2014 | 244 pages | PDF | 7 MB

Modeling of Electrical Overstress in Integrated Circuits  

Posted by AlenMiler at Nov. 12, 2014
Modeling of Electrical Overstress in Integrated Circuits

Modeling of Electrical Overstress in Integrated Circuits (The Springer International Series in Engineering and Computer Science) by Carlos H. Diaz
Springer; 1995 edition | October 4, 2013 | English | ISBN: 1461362059 | 148 pages | PDF | 11 MB

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated Circuits presents a comprehensive analysis of EOS/ESD-related failures in I/O protection devices in integrated circuits.
Failure Analysis of Integrated Circuits: Tools and Techniques (Repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)

Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)
Publisher: Springer; 1st edition (January 31, 1999) | ISBN: 0412145618 | Pages: 255 | PDF | 11.33 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques.
"Failure Analysis of Integrated Circuits: Tools and Techniques"  (Repost)

"Failure Analysis of Integrated Circuits: Tools and Techniques"
Publisher: Springer | 1999 | 255 pages | ISBN: 0412145618 | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.

Power Management Integrated Circuits  eBooks & eLearning

Posted by interes at Dec. 9, 2016
Power Management Integrated Circuits

Power Management Integrated Circuits (Devices, Circuits, and Systems) by Mona M. Hella and Patrick Mercier
English | 2016 | ISBN: 1482228939 | 347 pages | PDF | 72 MB