Failure Analysis of Integrated Circuits:

Failure Analysis of Integrated Circuits: Tools and Techniques (Repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
Failure Analysis of Integrated Circuits: Tools and Techniques (repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB
Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)

Failure Analysis of Integrated Circuits: Tools and Techniques by Lawrence C. Wagner (Repost)
Publisher: Springer; 1st edition (January 31, 1999) | ISBN: 0412145618 | Pages: 255 | PDF | 11.33 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques.
"Failure Analysis of Integrated Circuits: Tools and Techniques"  (Repost)

"Failure Analysis of Integrated Circuits: Tools and Techniques"
Publisher: Springer | 1999 | 255 pages | ISBN: 0412145618 | PDF | 11,3 MB

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques (repost)

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer | 1999 | ISBN: 0412145618 | 255 pages | PDF | 11,3 MB
Failure Analysis of Integrated Circuits: Tools and Techniques

Lawrence C. Wagner, "Failure Analysis of Integrated Circuits: Tools and Techniques"
Springer; 1st edition | ISBN: 0412145618 | 255 pages | PDF | 10 Mb

Design of Integrated Circuits for Optical Communications, 2nd Edition  eBooks & eLearning

Posted by arundhati at Dec. 6, 2016
Design of Integrated Circuits for Optical Communications, 2nd Edition

Behzad Razavi, "Design of Integrated Circuits for Optical Communications, 2nd Edition"
2012 | ISBN-10: 1118336941, 1118439457 | 442 pages | PDF | 17 MB
Analysis of Electrical Circuits with Variable Load Regime Parameters: Projective Geometry Method (2nd edition)

Analysis of Electrical Circuits with Variable Load Regime Parameters: Projective Geometry Method (2nd edition) By A. Penin
2016 | 440 Pages | ISBN: 3319284509 | PDF | 16 MB
Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits (Repost)

Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits By Wenjian Yu, Xiren Wang
2014 | 264 Pages | ISBN: 3642542972 | PDF | 9 MB
Design of Integrated Circuits for Optical Communications (Repost)

Behzad Razavi, "Design of Integrated Circuits for Optical Communications"
2002 | pages: 381 | ISBN: 0072822589 | PDF | 11,1 mb