Electron Energy Loss Spectroscopy And Surface Vibrations

Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)  eBooks & eLearning

Posted by interes at Aug. 30, 2014
Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)

R.F. Egerton, "Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition"
English | 2011 | ISBN: 144199582X | PDF | 503 pages | 11,4 MB

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)

R.F. Egerton, "Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition"
English | 2011 | ISBN: 144199582X | PDF | 503 pages | 11,4 MB

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.

Reflection Electron Microscopy and Spectroscopy for Surface Analysis (repost)  eBooks & eLearning

Posted by interes at Sept. 7, 2016
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (repost)

Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang
English | 2005-08-22 | ISBN: 0521017955 | 356 pages | PDF | 67,4 mb

Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Repost)  eBooks & eLearning

Posted by Specialselection at Jan. 29, 2013
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Repost)

Zhong Lin Wang, "Reflection Electron Microscopy and Spectroscopy for Surface Analysis"
English | 2005-08-22 | ISBN: 0521017955 | 356 pages | PDF | 67.4 mb

Reflection Electron Microscopy and Spectroscopy for Surface Analysis  eBooks & eLearning

Posted by rolexmaya at Sept. 23, 2010
Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Cambridge University Press | August 22, 2005 | ISBN-10: 0521017955 | 460 pages | PDF | 67 Mb

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS).
Applied RHEED: Reflection High-Energy Electron Diffraction During Crystal Growth (Springer Tracts in Modern Physics)

Applied RHEED: Reflection High-Energy Electron Diffraction During Crystal Growth (Springer Tracts in Modern Physics) by Wolfgang Braun
English | May 28, 1999 | ISBN: 3540651993 | 224 Pages | PDF | 25 MB

The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis (repost)

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB
Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas (2nd edition)

Channing C. Ahn - Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas (2nd edition)
Published: 2005-01-03 | ISBN: 3527405658 | PDF | 472 pages | 11.41 MB
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students.

Nanocharacterisation (2nd edition)  eBooks & eLearning

Posted by happy4all at Jan. 1, 2016
Nanocharacterisation (2nd edition)

Nanocharacterisation (2nd edition) By Angus I. Kirkland, Sarah J. Haigh
2014 | 374 Pages | ISBN: 184973805X | PDF | 25 MB