Electron Energy Loss Spectroscopy And Surface Vibrations

Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)  eBooks & eLearning

Posted by interes at Aug. 30, 2014
Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)

R.F. Egerton, "Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition"
English | 2011 | ISBN: 144199582X | PDF | 503 pages | 11,4 MB

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.
Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition (repost)

R.F. Egerton, "Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edition"
English | 2011 | ISBN: 144199582X | PDF | 503 pages | 11,4 MB

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.

Reflection Electron Microscopy and Spectroscopy for Surface Analysis (repost)  eBooks & eLearning

Posted by interes at Sept. 7, 2016
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (repost)

Reflection Electron Microscopy and Spectroscopy for Surface Analysis by Zhong Lin Wang
English | 2005-08-22 | ISBN: 0521017955 | 356 pages | PDF | 67,4 mb

Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Repost)  eBooks & eLearning

Posted by Specialselection at Jan. 29, 2013
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Repost)

Zhong Lin Wang, "Reflection Electron Microscopy and Spectroscopy for Surface Analysis"
English | 2005-08-22 | ISBN: 0521017955 | 356 pages | PDF | 67.4 mb

Reflection Electron Microscopy and Spectroscopy for Surface Analysis  eBooks & eLearning

Posted by rolexmaya at Sept. 23, 2010
Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Cambridge University Press | August 22, 2005 | ISBN-10: 0521017955 | 460 pages | PDF | 67 Mb

This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS).
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis (repost)

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB
Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas (2nd edition)

Channing C. Ahn - Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas (2nd edition)
Published: 2005-01-03 | ISBN: 3527405658 | PDF | 472 pages | 11.41 MB
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis

Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students.

Nanocharacterisation (2nd edition)  eBooks & eLearning

Posted by happy4all at Jan. 1, 2016
Nanocharacterisation (2nd edition)

Nanocharacterisation (2nd edition) By Angus I. Kirkland, Sarah J. Haigh
2014 | 374 Pages | ISBN: 184973805X | PDF | 25 MB
Atomic Scale Characterization and First-Principles Studies of SiN Interfaces (Springer Theses)

Atomic Scale Characterization and First-Principles Studies of SiN Interfaces (Springer Theses) by Weronika Walkosz
English | Apr. 8, 2011 | ISBN: 144197816X | 122 Pages | PDF | 3 MB

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).