Christian Schärf

Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design (repost)

Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design
by Christian C. Enz , Eric A. Vittoz
English | 2006 | ISBN: 047085541X | 328 pages | PDF | 3.71 MB
Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design

Christian C. Enz , Eric A. Vittoz , "Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design"
Wiley (September 11, 2006) | ISBN:047085541X | 328 pages | PDF | 2,9 Mb
Nonlinear Transistor Model Parameter Extraction Techniques (repost)

Nonlinear Transistor Model Parameter Extraction Techniques (The Cambridge RF and Microwave Engineering Series) by Dr Matthias Rudolph, Christian Fager and David E. Root
English | ISBN: 0521762103 | 2012 | PDF | 366 pages | 13,5 MB

Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects.