Built in Self Test

Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Repost)  eBooks & eLearning

Posted by arundhati at Feb. 11, 2017
Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Repost)

Sleiman Bou-Sleiman and Mohammed Ismail, "Built-in-Self-Test and Digital Self-Calibration for RF SoCs"
English | ISBN: 1441995471 | 2012 | 100 pages | PDF | 2 MB

A Designer's Guide to Built-in Self-Test (Repost)  eBooks & eLearning

Posted by Specialselection at April 16, 2014
A Designer's Guide to Built-in Self-Test (Repost)

Charles E. Stroud, "A Designer's Guide to Built-in Self-Test"
English | 2002-05-31 | ISBN: 1402070500 | 319 pages | PDF | 14.4 mb

Built-in-Self-Test and Digital Self-Calibration for RF SoCs  eBooks & eLearning

Posted by nebulae at Feb. 2, 2014
Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Sleiman Bou-Sleiman and Mohammed Ismail, "Built-in-Self-Test and Digital Self-Calibration for RF SoCs"
English | ISBN: 1441995471 | 2012 | 100 pages | PDF | 2 MB
A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) [Repost]

A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
by Charles E. Stroud
Springer | 2002 | ISBN: 1402070500 | Pages: 344 | PDF | Size: 15,65 MB

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) [Repost]  eBooks & eLearning

Posted by denisbul at Nov. 24, 2010
A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) [Repost]

A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
by Charles E. Stroud
Springer | 2002 | ISBN: 1402070500 | Pages: 344 | PDF | Size: 15,65 MB

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing) (Repost)

A Designer's Guide to Built-in Self-Test (Frontiers in Electronic Testing)
Publisher: Springer | ISBN: 1402070500 | edition 2002 | PDF | 338 pages | 14,9 mb

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution.

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test  eBooks & eLearning

Posted by tot167 at Feb. 27, 2008
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

R. Dean Adams “High Performance Memory Testing:
Design Principles, Fault Modeling and Self-Test"

Springer | 2005-10-30 | ISBN:1402072554 | PDF | 268 pages | 9,5 Mb

Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow: Design-for-Test Using Simulink, Stateflow, and Hdls

Evgeni Perelroyzen, "Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow: Design-for-Test Using Simulink, Stateflow, and Hdls"
English | ISBN: 0849330572 | 2007 | 320 pages | PDF | 27 MB

Test and Design-for-Testability in Mixed-Signal Integrated Circuits  eBooks & eLearning

Posted by tukotikko at Feb. 7, 2014
Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Test and Design-for-Testability in Mixed-Signal Integrated Circuits By Jose Luis Huertas Díaz
2004 | 316 Pages | ISBN: 1441954228 | PDF | 10 MB

Religious Voices in Self-Narratives (repost)  eBooks & eLearning

Posted by interes at Feb. 12, 2017
Religious Voices in Self-Narratives (repost)

Religious Voices in Self-Narratives (Religion and Society, Book 54) by Hetty Zock and Marjo Buitelaar
English | 2013 | ISBN: 1614512191 | 280 pages | PDF | 2,3 MB